A test facility for experimental HIL analysis of industrial embedded control systems

Research output: Contribution to conferencePaper

Original languageEnglish
Pages1-4
DOIs
Publication statusPublished - Sep 2012
EventIEEE 17th Conference on Emerging Technologies & Factory Automation - Krakow, Poland
Duration: 17 Sep 201221 Sep 2012

Conference

ConferenceIEEE 17th Conference on Emerging Technologies & Factory Automation
Abbreviated titleETFA 2012
CountryPoland
CityKrakow
Period17/09/1221/09/12

Cite this

Abugchem, F., Short, M., & Xu, D. (2012). A test facility for experimental HIL analysis of industrial embedded control systems. 1-4. Paper presented at IEEE 17th Conference on Emerging Technologies & Factory Automation, Krakow, Poland. https://doi.org/10.1109/ETFA.2012.6489762