Correlation of measured neon soft X-ray pulses of the INTI plasma focus with the reflected shock phase at 12KV

A. R. J. A Federico, Perk Lin Chong, Sor Heoh Saw

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Abstract

The six-phase Lee Model Code is used to fit the computed current waveform to the measured waveform of the INTI Plasma Focus (PF;2.2 kJ at 12 kV), a T2 PF device, operated as a source of Neon soft X-ray (SXR) with optimum yield around 2.5 - 3 Torr of neon. The characteristic He-like and H-like neon line SXR pulse is measured using a pair of SXR detectors with selected filters that, by subtraction, have a photon energy window of 900 to 1550 eV covering the region of the characteristic neon SXR lines. The aim of this paper is to investigate the correlation between the time histories of the measured Neon soft X-ray pulse and the reflected shock phase of the computed current waveform which has been fitted to the measured current waveform. Results shows that the characteristic neon SXR measured at 3.17 J with a pulse duration of 249 ns starts typically after the radial inward shock phase and increases in magnitude few ns before the pinch phase. It tails unto the first anomalous resistance, and decays at the second anomalous resistance.
Original languageEnglish
Pages (from-to)-
Number of pages11
JournalInternational Journal of Modern Physics: Conference Series
Volume32
DOIs
Publication statusPublished - 13 Aug 2014

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