Correlation of Measured Soft X-Ray Pulses With Modeled Dynamics of the Plasma Focus

Sing Lee, Sor Heoh Saw, R. S. Rawat, Paul Lee, Alireza Talebitaher, Ali Abdou, Perk Lin Chong, Federico Roy, Arwinder Singh, Donald Wong, K. Devi

Research output: Contribution to journalArticleResearchpeer-review

Abstract

The six-phase Lee model code is used to fit the computed
current waveform to the measured current waveform of
INTI plasma focus (PF; 2.2 kJ at 12 kV), a T2 PF device, operated
as a source of neon soft X-ray (SXR) with optimum yield around
2 torr of neon. The characteristic He-like and H-like neon line
SXR pulse is measured using a pair of SXR detectors with selected
filters that, by subtraction, has a photon energy window of 900
to 1550 eV covering the region of the characteristic neon SXR
lines. From the analysis of the fitted current and the measured
SXR pulses, the characteristic neon SXR pulses are correlated
to the pinch dynamics, and the subsequent slightly harder SXR
pulses are correlated to the anomalous resistance phase. The characteristic
neon SXR yield is measured; the pulse has a duration of
25 ns. The characteristic neon SXR typically starts 10 ns before
the pinch phase and continues through the end of the 10-ns pinch
phase, tailing into the anomalous resistance phase. Harder SXR
pulses, probably Bremsstrahlung, are correlated to the anomalous
resistance phase, with the main pulse occurring nearly 200 ns after
the characteristic neon SXR pulse.
Original languageEnglish
Pages (from-to)3196-3202
JournalIEEE Transactions on Plasma Science
Volume39
Issue number11
DOIs
Publication statusPublished - 1 Nov 2011

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plasma focus
neon
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x rays
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bremsstrahlung
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Cite this

Lee, S., Saw, S. H., Rawat, R. S., Lee, P., Talebitaher, A., Abdou, A., ... Devi, K. (2011). Correlation of Measured Soft X-Ray Pulses With Modeled Dynamics of the Plasma Focus. IEEE Transactions on Plasma Science, 39(11), 3196-3202. https://doi.org/10.1109/TPS.2011.2166812
Lee, Sing ; Saw, Sor Heoh ; Rawat, R. S. ; Lee, Paul ; Talebitaher, Alireza ; Abdou, Ali ; Chong, Perk Lin ; Roy, Federico ; Singh, Arwinder ; Wong, Donald ; Devi, K. / Correlation of Measured Soft X-Ray Pulses With Modeled Dynamics of the Plasma Focus. In: IEEE Transactions on Plasma Science. 2011 ; Vol. 39, No. 11. pp. 3196-3202.
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title = "Correlation of Measured Soft X-Ray Pulses With Modeled Dynamics of the Plasma Focus",
abstract = "The six-phase Lee model code is used to fit the computed current waveform to the measured current waveform of INTI plasma focus (PF; 2.2 kJ at 12 kV), a T2 PF device, operated as a source of neon soft X-ray (SXR) with optimum yield around 2 torr of neon. The characteristic He-like and H-like neon line SXR pulse is measured using a pair of SXR detectors with selected filters that, by subtraction, has a photon energy window of 900 to 1550 eV covering the region of the characteristic neon SXR lines. From the analysis of the fitted current and the measured SXR pulses, the characteristic neon SXR pulses are correlated to the pinch dynamics, and the subsequent slightly harder SXR pulses are correlated to the anomalous resistance phase. The characteristic neon SXR yield is measured; the pulse has a duration of 25 ns. The characteristic neon SXR typically starts 10 ns before the pinch phase and continues through the end of the 10-ns pinch phase, tailing into the anomalous resistance phase. Harder SXR pulses, probably Bremsstrahlung, are correlated to the anomalous resistance phase, with the main pulse occurring nearly 200 ns after the characteristic neon SXR pulse.",
author = "Sing Lee and Saw, {Sor Heoh} and Rawat, {R. S.} and Paul Lee and Alireza Talebitaher and Ali Abdou and Chong, {Perk Lin} and Federico Roy and Arwinder Singh and Donald Wong and K. Devi",
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Lee, S, Saw, SH, Rawat, RS, Lee, P, Talebitaher, A, Abdou, A, Chong, PL, Roy, F, Singh, A, Wong, D & Devi, K 2011, 'Correlation of Measured Soft X-Ray Pulses With Modeled Dynamics of the Plasma Focus', IEEE Transactions on Plasma Science, vol. 39, no. 11, pp. 3196-3202. https://doi.org/10.1109/TPS.2011.2166812

Correlation of Measured Soft X-Ray Pulses With Modeled Dynamics of the Plasma Focus. / Lee, Sing; Saw, Sor Heoh; Rawat, R. S.; Lee, Paul; Talebitaher, Alireza; Abdou, Ali; Chong, Perk Lin; Roy, Federico; Singh, Arwinder; Wong, Donald; Devi, K.

In: IEEE Transactions on Plasma Science, Vol. 39, No. 11, 01.11.2011, p. 3196-3202.

Research output: Contribution to journalArticleResearchpeer-review

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AU - Lee, Sing

AU - Saw, Sor Heoh

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AU - Lee, Paul

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AU - Abdou, Ali

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AU - Roy, Federico

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AB - The six-phase Lee model code is used to fit the computed current waveform to the measured current waveform of INTI plasma focus (PF; 2.2 kJ at 12 kV), a T2 PF device, operated as a source of neon soft X-ray (SXR) with optimum yield around 2 torr of neon. The characteristic He-like and H-like neon line SXR pulse is measured using a pair of SXR detectors with selected filters that, by subtraction, has a photon energy window of 900 to 1550 eV covering the region of the characteristic neon SXR lines. From the analysis of the fitted current and the measured SXR pulses, the characteristic neon SXR pulses are correlated to the pinch dynamics, and the subsequent slightly harder SXR pulses are correlated to the anomalous resistance phase. The characteristic neon SXR yield is measured; the pulse has a duration of 25 ns. The characteristic neon SXR typically starts 10 ns before the pinch phase and continues through the end of the 10-ns pinch phase, tailing into the anomalous resistance phase. Harder SXR pulses, probably Bremsstrahlung, are correlated to the anomalous resistance phase, with the main pulse occurring nearly 200 ns after the characteristic neon SXR pulse.

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SN - 0093-3813

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