Abstract
The combined use of white light interferometry (WLI) and atomic force microscopy (AFM) revealed pentagonal growth spirals on the surface of SAPO-34 crystals. Detailed considerations of the crystal geometry and preferred step energies may explain the unusual shape of these growth spirals. Combining WLI and AFM is an efficient method for screening and detailed analysis of growth hillocks on crystals larger than 10 μm.
| Original language | English |
|---|---|
| Pages (from-to) | 2824–2828 |
| Number of pages | 5 |
| Journal | Crystal Growth & Design |
| Volume | 10 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 28 May 2010 |
| Externally published | Yes |
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