TY - JOUR
T1 - High-Resolution scanning electron and atomic force microscopies
T2 - 4th International FEZA Conference
AU - Stevens, Sam Michael
AU - Jansson, Kjell
AU - John, Neena S.
AU - Terasaki, Osamu
AU - Anderson, Michael W.
AU - Castro, Maria
AU - Wright, Paul A.
AU - Cubillas, Pablo
PY - 2008/11/6
Y1 - 2008/11/6
N2 - It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.
AB - It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.
UR - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000283742800004&KeyUID=WOS:000283742800004
U2 - 10.1016/S0167-2991(08)80006-7
DO - 10.1016/S0167-2991(08)80006-7
M3 - Conference article
VL - 174
SP - 775
EP - 780
JO - Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference
JF - Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference
IS - B
Y2 - 2 September 2008 through 6 September 2008
ER -