High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces

Sam Michael Stevens; Kjell Jansson; Neena S. John; Osamu Terasaki; Michael W. Anderson; Maria Castro; Paul A. Wright; Pablo Cubillas

doi:10.1016/S0167-2991(08)80006-7

High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces

Sam Michael Stevens
, Kjell Jansson
, Neena S. John
, Osamu Terasaki
, Michael W. Anderson
, Maria Castro
, Paul A. Wright
, Pablo Cubillas

Research output: Contribution to journal › Conference article › peer-review

Abstract

It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.

Original language	English
Pages (from-to)	775-780
Number of pages	6
Journal	Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference
Volume	174
Issue number	B
DOIs	https://doi.org/10.1016/S0167-2991(08)80006-7
Publication status	Published - 6 Nov 2008
Externally published	Yes
Event	4th International FEZA Conference - Paris, Paris, France Duration: 2 Sept 2008 → 6 Sept 2008

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Stevens, S. M., Jansson, K., John, N. S., Terasaki, O., Anderson, M. W., Castro, M., Wright, P. A., & Cubillas, P. (2008). High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces. Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference, 174(B), 775-780. https://doi.org/10.1016/S0167-2991(08)80006-7

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title = "High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces",

abstract = "It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power. ",

author = "Stevens, \{Sam Michael\} and Kjell Jansson and John, \{Neena S.\} and Osamu Terasaki and Anderson, \{Michael W.\} and Maria Castro and Wright, \{Paul A.\} and Pablo Cubillas",

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month = nov,

day = "6",

doi = "10.1016/S0167-2991(08)80006-7",

language = "English",

volume = "174",

pages = "775--780",

journal = "Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference",

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}

Stevens, SM, Jansson, K, John, NS, Terasaki, O, Anderson, MW, Castro, M, Wright, PA & Cubillas, P 2008, 'High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces', Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference, vol. 174, no. B, pp. 775-780. https://doi.org/10.1016/S0167-2991(08)80006-7

High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces. / Stevens, Sam Michael; Jansson, Kjell; John, Neena S. et al.
In: Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference, Vol. 174, No. B, 06.11.2008, p. 775-780.

Research output: Contribution to journal › Conference article › peer-review

TY - JOUR

T1 - High-Resolution scanning electron and atomic force microscopies

T2 - 4th International FEZA Conference

AU - Stevens, Sam Michael

AU - Jansson, Kjell

AU - John, Neena S.

AU - Terasaki, Osamu

AU - Anderson, Michael W.

AU - Castro, Maria

AU - Wright, Paul A.

AU - Cubillas, Pablo

PY - 2008/11/6

Y1 - 2008/11/6

N2 - It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.

AB - It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power.

UR - http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000283742800004&KeyUID=WOS:000283742800004

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DO - 10.1016/S0167-2991(08)80006-7

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EP - 780

JO - Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference

JF - Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference

IS - B

Y2 - 2 September 2008 through 6 September 2008

ER -

Stevens SM, Jansson K, John NS, Terasaki O, Anderson MW, Castro M et al. High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces. Zeolites and Related Materials: Trends, Targets and Challenges, Proceedings of the 4th International Feza Conference. 2008 Nov 6;174(B):775-780. doi: 10.1016/S0167-2991(08)80006-7

High-Resolution scanning electron and atomic force microscopies: observation of nanometer features on zeolite Surfaces

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