Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Sam M. Stevens; Pablo Cubillas; Kjell Jansson; Osamu Terasaki; Michael W. Anderson; Paul A. Wright; Maria Castro

doi:10.1039/b804440f

Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Sam M. Stevens, Pablo Cubillas, Kjell Jansson, Osamu Terasaki, Michael W. Anderson, Paul A. Wright, Maria Castro

SHLS Life Sciences

Research output: Contribution to journal › Article › peer-review

Abstract

The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

Original language	English
Pages (from-to)	3894-3896
Number of pages	3
Journal	Chemical Communications
Volume	33
DOIs	https://doi.org/10.1039/b804440f
Publication status	Published - 26 Jun 2008

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title = "Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy",

abstract = "The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.",

author = "Stevens, {Sam M.} and Pablo Cubillas and Kjell Jansson and Osamu Terasaki and Anderson, {Michael W.} and Wright, {Paul A.} and Maria Castro",

year = "2008",

month = jun,

day = "26",

doi = "10.1039/b804440f",

language = "English",

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journal = "Chemical Communications",

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publisher = "Royal Society of Chemistry",

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T1 - Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

AU - Stevens, Sam M.

AU - Cubillas, Pablo

AU - Jansson, Kjell

AU - Terasaki, Osamu

AU - Anderson, Michael W.

AU - Wright, Paul A.

AU - Castro, Maria

PY - 2008/6/26

Y1 - 2008/6/26

N2 - The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

AB - The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

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U2 - 10.1039/b804440f

DO - 10.1039/b804440f

M3 - Article

SN - 1359-7345

VL - 33

SP - 3894

EP - 3896

JO - Chemical Communications

JF - Chemical Communications

ER -

Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Abstract

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