Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Sam M. Stevens; Pablo Cubillas; Kjell Jansson; Osamu Terasaki; Michael W. Anderson; Paul A. Wright; Maria Castro

doi:10.1039/b804440f

Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Sam M. Stevens
, Pablo Cubillas
, Kjell Jansson
, Osamu Terasaki
, Michael W. Anderson
, Paul A. Wright
, Maria Castro

SHLS Life Sciences

Research output: Contribution to journal › Article › peer-review

Abstract

The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

Original language	English
Pages (from-to)	3894-3896
Number of pages	3
Journal	Chemical Communications
Volume	33
DOIs	https://doi.org/10.1039/b804440f
Publication status	Published - 26 Jun 2008

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title = "Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy",

abstract = "The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.",

author = "Stevens, \{Sam M.\} and Pablo Cubillas and Kjell Jansson and Osamu Terasaki and Anderson, \{Michael W.\} and Wright, \{Paul A.\} and Maria Castro",

year = "2008",

month = jun,

day = "26",

doi = "10.1039/b804440f",

language = "English",

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journal = "Chemical Communications",

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T1 - Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

AU - Stevens, Sam M.

AU - Cubillas, Pablo

AU - Jansson, Kjell

AU - Terasaki, Osamu

AU - Anderson, Michael W.

AU - Wright, Paul A.

AU - Castro, Maria

PY - 2008/6/26

Y1 - 2008/6/26

N2 - The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

AB - The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

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U2 - 10.1039/b804440f

DO - 10.1039/b804440f

M3 - Article

SN - 1359-7345

VL - 33

SP - 3894

EP - 3896

JO - Chemical Communications

JF - Chemical Communications

ER -

Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Abstract

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