Optical Properties of Vacuum Evaporated amorphous CdTe Thin Films

R. Sathyamoorthy; S. Lalitha; S. Senthilarasu; A. Subbarayan; K. Natarajan

doi:10.1142/9789812704344_0049

Optical Properties of Vacuum Evaporated amorphous CdTe Thin Films

R. Sathyamoorthy, S. Lalitha, S. Senthilarasu, A. Subbarayan, K. Natarajan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In this paper, we have reported the optical properties of vacuum evaporated CdTe thin films. Thin films have been prepared from the polycrystalline powder of CdTe on well-cleaned glass substrate under the vacuum of 10−6 Torr. The thicknesses of the films were calculated by the quartz crystal monitor (57nm to 575nm). The transmittance characteristics of films were studied by the spectrophotometer. The films were analyzed by an X-ray diffractometer. Lattice constants of the films were determined from the X-ray diffraction pattern using a Nelson-Relay plot. The optical constants (the refractive index n and the absorption constant k) and absorption coefficient α were measured on CdTe thin films in the wavelength range 190nm to 2500 nm. In these, we have observed direct band gap decreases with increasing thickness. The refractive index is found to be decreases of the wavelength of incident photon.

Original language	English
Title of host publication	Electromagnetic Materials
Subtitle of host publication	Proceedings of the Symposium F, SUNTEC, Singapore, 7 – 12 December 2003
Editors	Lim Hock, Ong Chong Kim, Serguei Matitsine, Gan Yeow Beng
Publisher	World Scientific Publishing Co.
Pages	243-246
Number of pages	4
ISBN (Electronic)	9789814485968
ISBN (Print)	9789812383723
DOIs	https://doi.org/10.1142/9789812704344_0049
Publication status	Published - 1 Dec 2003
Externally published	Yes
Event	International Conference on Materials for Advanced Technologies - SUNTEC, Singapore, Singapore Duration: 7 Dec 2003 → 12 Dec 2003

Conference

Conference	International Conference on Materials for Advanced Technologies
Country/Territory	Singapore
City	Singapore
Period	7/12/03 → 12/12/03

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Cite this

Sathyamoorthy, R., Lalitha, S., Senthilarasu, S., Subbarayan, A., & Natarajan, K. (2003). Optical Properties of Vacuum Evaporated amorphous CdTe Thin Films. In L. Hock, O. C. Kim, S. Matitsine, & G. Y. Beng (Eds.), Electromagnetic Materials: Proceedings of the Symposium F, SUNTEC, Singapore, 7 – 12 December 2003 (pp. 243-246). World Scientific Publishing Co.. https://doi.org/10.1142/9789812704344_0049

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abstract = "In this paper, we have reported the optical properties of vacuum evaporated CdTe thin films. Thin films have been prepared from the polycrystalline powder of CdTe on well-cleaned glass substrate under the vacuum of 10−6 Torr. The thicknesses of the films were calculated by the quartz crystal monitor (57nm to 575nm). The transmittance characteristics of films were studied by the spectrophotometer. The films were analyzed by an X-ray diffractometer. Lattice constants of the films were determined from the X-ray diffraction pattern using a Nelson-Relay plot. The optical constants (the refractive index n and the absorption constant k) and absorption coefficient α were measured on CdTe thin films in the wavelength range 190nm to 2500 nm. In these, we have observed direct band gap decreases with increasing thickness. The refractive index is found to be decreases of the wavelength of incident photon.",

author = "R. Sathyamoorthy and S. Lalitha and S. Senthilarasu and A. Subbarayan and K. Natarajan",

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Sathyamoorthy, R, Lalitha, S, Senthilarasu, S, Subbarayan, A & Natarajan, K 2003, Optical Properties of Vacuum Evaporated amorphous CdTe Thin Films. in L Hock, OC Kim, S Matitsine & GY Beng (eds), Electromagnetic Materials: Proceedings of the Symposium F, SUNTEC, Singapore, 7 – 12 December 2003. World Scientific Publishing Co., pp. 243-246, International Conference on Materials for Advanced Technologies, Singapore, Singapore, 7/12/03. https://doi.org/10.1142/9789812704344_0049

Optical Properties of Vacuum Evaporated amorphous CdTe Thin Films. / Sathyamoorthy, R.; Lalitha, S.; Senthilarasu, S. et al.
Electromagnetic Materials: Proceedings of the Symposium F, SUNTEC, Singapore, 7 – 12 December 2003. ed. / Lim Hock; Ong Chong Kim; Serguei Matitsine; Gan Yeow Beng. World Scientific Publishing Co., 2003. p. 243-246.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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PY - 2003/12/1

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N2 - In this paper, we have reported the optical properties of vacuum evaporated CdTe thin films. Thin films have been prepared from the polycrystalline powder of CdTe on well-cleaned glass substrate under the vacuum of 10−6 Torr. The thicknesses of the films were calculated by the quartz crystal monitor (57nm to 575nm). The transmittance characteristics of films were studied by the spectrophotometer. The films were analyzed by an X-ray diffractometer. Lattice constants of the films were determined from the X-ray diffraction pattern using a Nelson-Relay plot. The optical constants (the refractive index n and the absorption constant k) and absorption coefficient α were measured on CdTe thin films in the wavelength range 190nm to 2500 nm. In these, we have observed direct band gap decreases with increasing thickness. The refractive index is found to be decreases of the wavelength of incident photon.

AB - In this paper, we have reported the optical properties of vacuum evaporated CdTe thin films. Thin films have been prepared from the polycrystalline powder of CdTe on well-cleaned glass substrate under the vacuum of 10−6 Torr. The thicknesses of the films were calculated by the quartz crystal monitor (57nm to 575nm). The transmittance characteristics of films were studied by the spectrophotometer. The films were analyzed by an X-ray diffractometer. Lattice constants of the films were determined from the X-ray diffraction pattern using a Nelson-Relay plot. The optical constants (the refractive index n and the absorption constant k) and absorption coefficient α were measured on CdTe thin films in the wavelength range 190nm to 2500 nm. In these, we have observed direct band gap decreases with increasing thickness. The refractive index is found to be decreases of the wavelength of incident photon.

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BT - Electromagnetic Materials

A2 - Hock, Lim

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Sathyamoorthy R, Lalitha S, Senthilarasu S, Subbarayan A, Natarajan K. Optical Properties of Vacuum Evaporated amorphous CdTe Thin Films. In Hock L, Kim OC, Matitsine S, Beng GY, editors, Electromagnetic Materials: Proceedings of the Symposium F, SUNTEC, Singapore, 7 – 12 December 2003. World Scientific Publishing Co. 2003. p. 243-246 doi: 10.1142/9789812704344_0049

Optical Properties of Vacuum Evaporated amorphous CdTe Thin Films

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