Abstract
Zincphthalocyanine (ZnPc) thin films were prepared by the vacuum evaporation method under a pressure of 10-6 mbar. The X-ray diffraction analysis of vacuum evaporated ZnPc films reveals that the structure of the films is polycrystalline in nature. The photoconduction properties have been studied in the wavelength range 400 –800nm using suitable masks. The Photoconductivity of the films as a function of light intensity and applied voltage were studied and results were discussed in detail. The photoconduction was found to increase with higher light illumination and maximum at the band edge of the ZnPc thin film.
| Original language | English |
|---|---|
| Pages (from-to) | 504-510 |
| Number of pages | 7 |
| Journal | Crystal Research and Technology: Journal of Experimental and Industrial Crystallography |
| Volume | 42 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 4 Apr 2007 |
| Externally published | Yes |