Robust crystalline silicon photovoltaic module (c-Si PVM) for the tropical climate: Future facing the technology

Frank K.A. Nyarko, G. Takyi, Emeka H. Amalu

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)
178 Downloads (Pure)

Abstract

A critical impediment to the adoption and sustained deployment of crystalline silicon photovoltaic modules (c-Si PVMs) in the tropical climate is the accelerated degradation of their interconnections. At 40.7% c-Si PVM interconnect failure rate worldwide and significantly higher in the tropics. A review of impact of elevated ambient temperature operations on accelerated interconnection degradation is critical to achieving the system's sustainability and reliability up to the 25-year design lifespan. This study reviews critical module's operational parameters to advise on the future facing creation of robust module for the tropical region. Key areas reviewed include manufacturing process, solar cell efficiency, interconnection technology and R&D parameters. The review discusses the state-of-the-art in c-Si PVM interconnection technologies and propose back-junction-back-contact (BJ-BC) cell technology for adoption in the manufacture of the next generation of robust c-Si PVM for the tropics. The review findings provide insight into the future facing the robust c-Si PVM technology that is useful to the module design engineers.

Original languageEnglish
Article numbere00359
JournalScientific African
Volume8
DOIs
Publication statusPublished - 21 Mar 2020

Bibliographical note

Funding Information:
The authors acknowledge the financial support received from the USAID for the PRESSA project Sub-Grant no. 2000004829 through the US National Academy of Sciences. The technical support provided by Dr. Mani and Sai Tatapudi at Arizona State University Photovoltaic Reliability Laboratory (ASU PRL) is greatly appreciated.

Funding Information:
The authors acknowledge the financial support received from the USAID for the PRESSA project Sub-Grant no. 2000004829 through the US National Academy of Sciences . The technical support provided by Dr. Mani and Sai Tatapudi at Arizona State University Photovoltaic Reliability Laboratory (ASU PRL) is greatly appreciated.

Publisher Copyright:
© 2020

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