Abstract
In this article, we have reported the structural, optical and electrical properties of ZnPc thin films. The samples were prepared by thermal evaporation method. The thickness of the samples were measured by the quartz crystal monitor. The structural analysis were carried out by X-ray diffraction (XRD) and Scanning Electron Microscope (SEM). The XRD studies and SEM studies of the ZnPc thin films are reveals that the films are amorphous in nature. The optical properties in the transmission mode have studied by spectrophotometer in the visible region. The possible transition in these films is found to be direct and allowed. AC conduction mechanism and dielectric properties in these films (Al-ZnPc-Al structure) were studied by the LCR meter for various frequencies (12 Hz to 100 KHz) at different temperatures. The field dependence behaviour on activation energy and possible conduction mechanism in the ZnPc films under dc field have also been discussed.
| Original language | English |
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| Title of host publication | Electromagnetic Materials |
| Subtitle of host publication | Proceedings of the Symposium F, SUNTEC, Singapore, 7 – 12 December 2003 |
| Editors | Lim Hock, Ong Chong Kim, Serguei Matitsine, Gan Yeow Beng |
| Publisher | World Scientific Publishing Co. |
| Pages | 247-250 |
| Number of pages | 4 |
| ISBN (Electronic) | 9789814485968 |
| ISBN (Print) | 9789812383723 |
| Publication status | Published - 7 Dec 2003 |
| Externally published | Yes |
| Event | International Conference on Materials for Advanced Technologies - SUNTEC, Singapore, Singapore Duration: 7 Dec 2003 → 12 Dec 2003 |
Conference
| Conference | International Conference on Materials for Advanced Technologies |
|---|---|
| Country/Territory | Singapore |
| City | Singapore |
| Period | 7/12/03 → 12/12/03 |