Structural properties of swift heavy ion beam irradiated Fe/Si bilayers

S Senthilarasu; R. Sathyamoorthy; S. Lalitha; D.K. Avasthi

doi:10.1016/j.tsf.2005.04.051

Structural properties of swift heavy ion beam irradiated Fe/Si bilayers

S Senthilarasu, R. Sathyamoorthy, S. Lalitha, D.K. Avasthi

Research output: Contribution to journal › Article › peer-review

Abstract

The Fe/Si multilayers were prepared by electron beam evaporation in a cryo-pumped vacuum deposition system. Ag+ and Au+ ions of 100 MeV at two different fluencies such as 1 × 1012 ions/cm2 and 1 × 1013 ions/cm2 at a pressure of 10− 7 torr were used to irradiate the Fe/Si samples. The irradiated samples were analyzed by High-Resolution XRD and it reveals that the irradiated films are having polycrystalline nature and it confirms the formation of the β-FeSi2. The structural parameters such as crystallite size (D), strain (ε) and dislocation density (δ) have been evaluated from the XRD spectrum. The role of the substrates and the influence of swift heavy ions on the formation of β-FeSi2 have been discussed in this paper.

Original language	English
Pages (from-to)	177-181
Number of pages	5
Journal	Thin Solid Films
Volume	490
Issue number	2
DOIs	https://doi.org/10.1016/j.tsf.2005.04.051
Publication status	Published - 1 Nov 2005
Externally published	Yes

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title = "Structural properties of swift heavy ion beam irradiated Fe/Si bilayers",

abstract = "The Fe/Si multilayers were prepared by electron beam evaporation in a cryo-pumped vacuum deposition system. Ag+ and Au+ ions of 100 MeV at two different fluencies such as 1 × 1012 ions/cm2 and 1 × 1013 ions/cm2 at a pressure of 10− 7 torr were used to irradiate the Fe/Si samples. The irradiated samples were analyzed by High-Resolution XRD and it reveals that the irradiated films are having polycrystalline nature and it confirms the formation of the β-FeSi2. The structural parameters such as crystallite size (D), strain (ε) and dislocation density (δ) have been evaluated from the XRD spectrum. The role of the substrates and the influence of swift heavy ions on the formation of β-FeSi2 have been discussed in this paper.",

author = "S Senthilarasu and R. Sathyamoorthy and S. Lalitha and D.K. Avasthi",

year = "2005",

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doi = "10.1016/j.tsf.2005.04.051",

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TY - JOUR

T1 - Structural properties of swift heavy ion beam irradiated Fe/Si bilayers

AU - Senthilarasu, S

AU - Sathyamoorthy, R.

AU - Lalitha, S.

AU - Avasthi, D.K.

PY - 2005/11/1

Y1 - 2005/11/1

N2 - The Fe/Si multilayers were prepared by electron beam evaporation in a cryo-pumped vacuum deposition system. Ag+ and Au+ ions of 100 MeV at two different fluencies such as 1 × 1012 ions/cm2 and 1 × 1013 ions/cm2 at a pressure of 10− 7 torr were used to irradiate the Fe/Si samples. The irradiated samples were analyzed by High-Resolution XRD and it reveals that the irradiated films are having polycrystalline nature and it confirms the formation of the β-FeSi2. The structural parameters such as crystallite size (D), strain (ε) and dislocation density (δ) have been evaluated from the XRD spectrum. The role of the substrates and the influence of swift heavy ions on the formation of β-FeSi2 have been discussed in this paper.

AB - The Fe/Si multilayers were prepared by electron beam evaporation in a cryo-pumped vacuum deposition system. Ag+ and Au+ ions of 100 MeV at two different fluencies such as 1 × 1012 ions/cm2 and 1 × 1013 ions/cm2 at a pressure of 10− 7 torr were used to irradiate the Fe/Si samples. The irradiated samples were analyzed by High-Resolution XRD and it reveals that the irradiated films are having polycrystalline nature and it confirms the formation of the β-FeSi2. The structural parameters such as crystallite size (D), strain (ε) and dislocation density (δ) have been evaluated from the XRD spectrum. The role of the substrates and the influence of swift heavy ions on the formation of β-FeSi2 have been discussed in this paper.

U2 - 10.1016/j.tsf.2005.04.051

DO - 10.1016/j.tsf.2005.04.051

M3 - Article

SN - 0040-6090

VL - 490

SP - 177

EP - 181

JO - Thin Solid Films

JF - Thin Solid Films

IS - 2

ER -

Structural properties of swift heavy ion beam irradiated Fe/Si bilayers

Abstract

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