SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield

Sor Heoh Saw, Rajdeep Singh Rawat, Paul Lee, Alireza Talebitaher, Ali E. Abdou, Perk Lin Chong, Federico Roy, Jalil Ali, Sing Lee

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)3166-3172
JournalIEEE Transactions on Plasma Science
Volume41
Issue number11
DOIs
Publication statusPublished - 1 Nov 2013

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