SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield

Sor Heoh Saw; Rajdeep Singh Rawat; Paul Lee; Alireza Talebitaher; Ali E. Abdou; Perk Lin Chong; Federico Roy; Jalil Ali; Sing Lee

doi:10.1109/TPS.2013.2281333

SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield

Sor Heoh Saw, Rajdeep Singh Rawat, Paul Lee, Alireza Talebitaher, Ali E. Abdou, Perk Lin Chong, Federico Roy, Jalil Ali, Sing Lee

SCEDT Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	3166-3172
Journal	IEEE Transactions on Plasma Science
Volume	41
Issue number	11
DOIs	https://doi.org/10.1109/TPS.2013.2281333
Publication status	Published - 1 Nov 2013

Access to Document

10.1109/TPS.2013.2281333

http://ieeexplore.ieee.org/document/6612699/

Cite this

@article{343df7fd869e4e0990b75cc637cbf9b4,

title = "SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield",

author = "Saw, {Sor Heoh} and Rawat, {Rajdeep Singh} and Paul Lee and Alireza Talebitaher and Abdou, {Ali E.} and Chong, {Perk Lin} and Federico Roy and Jalil Ali and Sing Lee",

year = "2013",

month = nov,

day = "1",

doi = "10.1109/TPS.2013.2281333",

language = "English",

volume = "41",

pages = "3166--3172",

journal = "IEEE Transactions on Plasma Science",

issn = "0093-3813",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "11",

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TY - JOUR

T1 - SXR Measurements in INTI PF Operated in Neon to Identify Typical (Normal N) Profile for Shots With Good Yield

AU - Saw, Sor Heoh

AU - Rawat, Rajdeep Singh

AU - Lee, Paul

AU - Talebitaher, Alireza

AU - Abdou, Ali E.

AU - Chong, Perk Lin

AU - Roy, Federico

AU - Ali, Jalil

AU - Lee, Sing

PY - 2013/11/1

Y1 - 2013/11/1

U2 - 10.1109/TPS.2013.2281333

DO - 10.1109/TPS.2013.2281333

M3 - Article

SN - 0093-3813

VL - 41

SP - 3166

EP - 3172

JO - IEEE Transactions on Plasma Science

JF - IEEE Transactions on Plasma Science

IS - 11

ER -