The role of SiO2 impurities in the microstructure and properties of Y-TZP

S. N.B. Hodgson, J. Cawley, M. Clubley

    Research output: Contribution to journalArticlepeer-review

    8 Citations (Scopus)

    Abstract

    A study has been carried out into the effects of SiO2 impurities at the 0-1 mass% level on the sintering characteristics, microstructure, phase composition, and mechanical properties of Y-TZP. The results show that SiO2 improves sintering at low temperatures, but gives rise to increasing grain boundary phase formation and reduction in sintered density for higher sintering temperatures. X-ray diffraction studies indicated that SiO2 impurities at these levels did not significantly affect the stability of the tetragonal phase responsible for the transformation-toughening phenomena, although significant effects on the mechanical properties of the material were observed. A model is proposed to account for these effects in terms of the microstructural changes associated with the presence of SiO2 and changes in sintering conditions.

    Original languageEnglish
    Pages (from-to)139-145
    Number of pages7
    JournalJournal of Materials Processing Technology
    Volume86
    Issue number1-3
    DOIs
    Publication statusPublished - 15 Feb 1998

    Fingerprint Dive into the research topics of 'The role of SiO<sub>2</sub> impurities in the microstructure and properties of Y-TZP'. Together they form a unique fingerprint.

    Cite this