The role of SiO2 impurities in the microstructure and properties of Y-TZP

S. N.B. Hodgson; J. Cawley; M. Clubley

doi:10.1016/S0924-0136(98)00302-1

The role of SiO₂ impurities in the microstructure and properties of Y-TZP

S. N.B. Hodgson, J. Cawley, M. Clubley

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Abstract

A study has been carried out into the effects of SiO₂ impurities at the 0-1 mass% level on the sintering characteristics, microstructure, phase composition, and mechanical properties of Y-TZP. The results show that SiO₂ improves sintering at low temperatures, but gives rise to increasing grain boundary phase formation and reduction in sintered density for higher sintering temperatures. X-ray diffraction studies indicated that SiO₂ impurities at these levels did not significantly affect the stability of the tetragonal phase responsible for the transformation-toughening phenomena, although significant effects on the mechanical properties of the material were observed. A model is proposed to account for these effects in terms of the microstructural changes associated with the presence of SiO₂ and changes in sintering conditions.

Original language	English
Pages (from-to)	139-145
Number of pages	7
Journal	Journal of Materials Processing Technology
Volume	86
Issue number	1-3
DOIs	https://doi.org/10.1016/S0924-0136(98)00302-1
Publication status	Published - 15 Feb 1998

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abstract = "A study has been carried out into the effects of SiO2 impurities at the 0-1 mass\% level on the sintering characteristics, microstructure, phase composition, and mechanical properties of Y-TZP. The results show that SiO2 improves sintering at low temperatures, but gives rise to increasing grain boundary phase formation and reduction in sintered density for higher sintering temperatures. X-ray diffraction studies indicated that SiO2 impurities at these levels did not significantly affect the stability of the tetragonal phase responsible for the transformation-toughening phenomena, although significant effects on the mechanical properties of the material were observed. A model is proposed to account for these effects in terms of the microstructural changes associated with the presence of SiO2 and changes in sintering conditions.",

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AU - Hodgson, S. N.B.

AU - Cawley, J.

AU - Clubley, M.

PY - 1998/2/15

Y1 - 1998/2/15

N2 - A study has been carried out into the effects of SiO2 impurities at the 0-1 mass% level on the sintering characteristics, microstructure, phase composition, and mechanical properties of Y-TZP. The results show that SiO2 improves sintering at low temperatures, but gives rise to increasing grain boundary phase formation and reduction in sintered density for higher sintering temperatures. X-ray diffraction studies indicated that SiO2 impurities at these levels did not significantly affect the stability of the tetragonal phase responsible for the transformation-toughening phenomena, although significant effects on the mechanical properties of the material were observed. A model is proposed to account for these effects in terms of the microstructural changes associated with the presence of SiO2 and changes in sintering conditions.

AB - A study has been carried out into the effects of SiO2 impurities at the 0-1 mass% level on the sintering characteristics, microstructure, phase composition, and mechanical properties of Y-TZP. The results show that SiO2 improves sintering at low temperatures, but gives rise to increasing grain boundary phase formation and reduction in sintered density for higher sintering temperatures. X-ray diffraction studies indicated that SiO2 impurities at these levels did not significantly affect the stability of the tetragonal phase responsible for the transformation-toughening phenomena, although significant effects on the mechanical properties of the material were observed. A model is proposed to account for these effects in terms of the microstructural changes associated with the presence of SiO2 and changes in sintering conditions.

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SP - 139

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JO - Journal of Materials Processing Technology

JF - Journal of Materials Processing Technology

IS - 1-3

ER -

The role of SiO₂ impurities in the microstructure and properties of Y-TZP

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