Thermally evaporated ZnPc thin films—band gap dependence on thickness

S. Senthilarasu, R. Sathyamoorthy, S. Lalitha, A. Subbarayan, K. Natarajan

Research output: Contribution to journalArticlepeer-review

Abstract

The ZincPhthalocyanine (ZnPc) thin films were obtained by thermal evaporation method. The X-ray diffraction analysis of vacuum evaporated ZnPc films reveals that the structure of the film is polycrystalline in nature for the samples grown at higher substrate temperatures. The crystallite size (D), dislocation density (δ) and strain (ε) were calculated. The optical band gap energy has been calculated from the (αhν)2 vs. hν plot. The optical band gap energy of the ZnPc films was found to decrease with increase in film thickness.

Original languageEnglish
Pages (from-to)179-186
Number of pages8
JournalSolar Energy Materials and Solar Cells
Volume82
Issue number1-2
Early online date6 Feb 2004
Publication statusPublished - 1 May 2004
Externally publishedYes

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