Abstract
The ZincPhthalocyanine (ZnPc) thin films were obtained by thermal evaporation method. The X-ray diffraction analysis of vacuum evaporated ZnPc films reveals that the structure of the film is polycrystalline in nature for the samples grown at higher substrate temperatures. The crystallite size (D), dislocation density (δ) and strain (ε) were calculated. The optical band gap energy has been calculated from the (αhν)2 vs. hν plot. The optical band gap energy of the ZnPc films was found to decrease with increase in film thickness.
Original language | English |
---|---|
Pages (from-to) | 179-186 |
Number of pages | 8 |
Journal | Solar Energy Materials and Solar Cells |
Volume | 82 |
Issue number | 1-2 |
Early online date | 6 Feb 2004 |
Publication status | Published - 1 May 2004 |
Externally published | Yes |