Utilising precursor ion and second-generation product ion scanning techniques in a four-sector mass spectrometer for the analysis of polymer additives

Anthony T. Jackson, Richard C.K. Jennings, Hilary T. Yates, James Scrivens, Keith R. Jennings

    Research output: Contribution to journalArticle

    8 Citations (Scopus)

    Abstract

    The analysis of organic polymer additives by means of mass spectrometry (MS) has been shown to be aided by the utilisation of precursor ion and second-generation product ion (MS3) scanning experiments. These techniques have been used to determine the fragmentation pathways of these materials under high-energy conditions. A four-sector mass spectrometer was employed to generate precursor ion and MS3 spectra which indicated that the routes of dissociation for the generation of many fragment ions, observed as intense peaks in the product ion spectra, were relatively complex. Fragmentation schemes are proposed to account for the data observed in the spectra.

    Original languageEnglish
    Pages (from-to)113-120
    Number of pages8
    JournalEuropean Journal of Mass Spectrometry
    Volume3
    Issue number2
    Publication statusPublished - 1 Dec 1997

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